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Development of High Reliability Synaptic Devices for Artificial Intelligence Algorithm Computing

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  • 2023-04-21
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Professor Lee Dae-seok (Department of Electronic Materials Engineering) Research Team Develops High Reliability Synaptic Devices for Artificial Intelligence Algorithm Computing
- Journal of Materials Chemistry C (JCR IF 8.067, JCR Rank: 14.6%)  

[From left, Han Gun-hee, Seo Jong-sun, Kim Hye-jin, Prof. Lee Daeseok]

[From left, Han Gun-hee, Seo Jong-sun, Kim Hye-jin, Prof. Lee Daeseok]？

 

Han Gun-hee (first author), Seo Jong-sun, Kim Hye-jin, and Lee Dae-seok of the research team of Professor Lee Dae-seok of Kwangwoon University identified the causes that affect the reliability of synaptic devices for neuromorphic systems and developed synaptic devices with improved reliability.

 

Development of High Reliability Synaptic Devices for Artificial Intelligence Algorithm Computing

 

This study was conducted with the support of the Ministry of Science and ICT and the Information and Communication Planning and Evaluation Agency's project to foster university ICT research centers (IITP-2023-RS-2022-00156225), and was published as "Role of the RAM-based CMOS" in the Journal of Materials Chemistry C (JCR IF 8.067, JCR Rank: 14.6%)

 

Weblink: (https://doi.org/10.1039/D2TC05552J)

 
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